Presentation

 

The 1st International Conference on Helium Ion Microscopy and Emerging Focused Ion Beam Technologies (HEFIB 2016) was held from 8 to 10 June 2016 in the unique premises of Neumünster Abbey in Luxembourg City.

The purpose of the conference was to bring together the rapidly growing community active in the fields of Helium Ion Microscopy and other emerging Focused Ion Beam technologies in view of stimulating scientific and technical exchanges.

Programme & Main Topics

The conference was focused on 4 main topics:

  • Nanofabrication
  • Analysis
  • Instrumentation
  • Sec. Electron Imaging

> More information about the programme

Invited Speakers

  • Stuart Boden, University of Southampton, Southampton, UK
    "Dopant profiling in the helium ion microscope"
  • James Fitzpatrick, Washington University School of Medicine, St. Louis, USA
    "Biological Applications of Ion Microscopy"
  • Kaoru Ohya, Tokushima University, Tokushima, Japan
    "Modelling secondary electron emission from nanostructured materials in scanning ion microscopes: some interesting similarities and differences from scanning electron microscope"
  • Olga Ovchinnikova, Oak Ridge National Laboratory, Oak Ridge, TN ,USA
    "Building with Ions: Development of In-Situ Liquid Cell Microscopy for the Helium Ion Microscope"
  • Yuri Petrov, St. Petersburg State University, St. Petersburg, Russia
    "Ion Reflection and Ion-Electron Interaction in the Helium Ion Microscope"
  • Silvio Rizzoli, Universität Göttingen, Göttingen , Germany
    "Correlated fluorescence and SIMS imaging on the nanoscale"
  • Marek Schmidt, Japan Advanced Institute of Science and Technology (JAIST), Nomi, Japan
    "Recent progress in helium-ion-based nanofabrication for advanced graphene device applications"
  • Ferdinand Schmidt-Kaler, Universität Mainz, Mainz, Germany
    "Nanoscopic single particle microscopy with a deterministic single ion source"
  • Sybren Sijbrandij, Zeiss, USA
    "Recent Developments in Helium and Neon Ion Microscopy Instrumentation"

> More information about the invited speakers

HEFIB 2016 Flyer

>> Download HEFIB2016 presentation flyer - 1.8KB

Organiser, Sponsor & Partner

Organised by
Sponsored by

Supported by the Fonds National de la Recherche, Luxembourg